Electron-beam lithography applications at ETH Zurich
نویسنده
چکیده
A triangular lattice of holes is etched deeply (> 3 μm) into the substrate using a combination of EBL and inductively coupled plasma reactive ion etching. Accuracy and reliability of the pattern transfer into the resist by EBL is ensured by using the NanoPECS software to correct for proximity effects. Devices are designed using 2D and 3D modelling tools and characterized using the End-Fire (port-to-port) technique and scanning near-fi eld optical microscopy. We have for instance designed a PhC-based power splitter that theoretically demonstrates 42% transmission per branch and an excellent measured 50 / 50% power balance (fi gure 1).
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تاریخ انتشار 2006